Data di Pubblicazione:
2002
Abstract:
The contrast-matching SANS technique has been utilised to determine inter-pillar distances (and surface texture) in montmorillonite and beidellite pillared smectite clays; they lie in the range 1.40-1.80 nm, reflecting different inter-pillar orderings.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
SANS; argille pilastrate
Elenco autori:
DE STEFANIS, Adriana; Tomlinson, ANTHONY ARTHUR
Link alla scheda completa:
Pubblicato in: