Data di Pubblicazione:
2007
Abstract:
(100 - x)SiO2 - xHfO2 (x = 10, 20, 30 mol) glassceramics planar waveguides activated by 0.3 mol% Er3+ ions were prepared by solgel route, using dip-coating deposition on v-SiO2 substrates. High resolution transmission electron microscopy has shown that after an adapted heat treatment, the resulting materials show nanocrystalline structures. The glassceramics waveguides were characterized by m-line, Raman, losses measurements, and photoluminescence spectroscopy. Photoluminescence spectroscopy has demonstrated the embedding of erbium ions in the nanocrystals. The results are discussed with the aim of assessing the role of hafnia on the structural, optical and spectroscopic properties of erbium doped silica hafnia glassceramics planar waveguides.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Glassceramics; Nanocrystals; Planar waveguides; Optical spectroscopy; Rare-earths in glasses
Elenco autori:
Armellini, Cristina; Jestin, Yoann; Chiappini, Andrea; NUNZI CONTI, Gualtiero; Ferrari, Maurizio; Pelli, Stefano; Chiasera, Alessandro; Righini, Giancarlo
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