Time-Resolved Energy Dispersive X-Ray Reflectometry Measurement on ruthenium phthalocyanine gas sensing films

The energy dispersive (ED)variant of the conventional x-ray reflectivity (XR) provides an atomic scale determination of the morphological characteristics of thin films , such as their thickness and surface roughness . We report on the, in situ, EDXR measurements of the (minimal) morphological changes of ruthenium phthalocyanine gas sensing thin films . A series of reflectivity spectra have been collected , during the exposure of the films to a gas flux of Nitrogen Oxide (NO)x molecules . The measurements allowed a very high density time sampling of the evolution of the two morphological parameters , providing important information on the gas-film interaction .