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Micro-Raman depth profiling on polished cross section: the mapping of oxalates used in protective treatment of carbonatic substrate

Articolo
Data di Pubblicazione:
2008
Abstract:
We present the first depth profiling on a polished cross-section carried out by micro-Raman spectroscopy aimed at investigating the penetration depth of an inorganic protective material (ammonium oxalate) applied on carbonatic surfaces (ancient plaster) and to detect the distribution of mineralogical phases inside the material. The reason for such a Rapid Communication is the importance of our study for the field of conservation, in which at present the treatment with oxalates is a hot issue.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
micro-Raman spectroscopy; polished cross-section; depth profiling; oxalate; calcite
Elenco autori:
Realini, Marco; Colombo, Chiara; Conti, Claudia
Autori di Ateneo:
COLOMBO CHIARA
CONTI CLAUDIA
REALINI MARCO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/119089
Pubblicato in:
JOURNAL OF RAMAN SPECTROSCOPY
Journal
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