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APPLIED PHYSICS EXPRESS (ONLINE)
Journal
Identifier:
E214908
ISSN:
1882-0786
Overview
Overview
Outputs (3)
Ab initio study of Ge intercalation in epitaxial graphene on SiC(0001)
Academic Article
Effects of Thermal Treatments on the Trapping Properties of HfO2 Films for Charge Trap Memories
Academic Article
Microwave Annealing of Very High Dose Aluminum-Implanted 4H-SiC
Academic Article
No Results Found
