Codice:
E050722
ISSN:
1012-0394
Dati Generali
Pubblicazioni (70)
Beam injection studies of dislocations and oxygen precipitates in semiconductor silicon
Contributo in Atti di convegnoCobalt contamination in silicon
ArticoloEffect of self-interstitials - nanovoids interaction on two-dimensional diffusion and activation of implanted B in Si
Contributo in Atti di convegnoInternal gettering efficiency in p/p+ and p/p- silicon epistructures
Contributo in Atti di convegnoMC-IR-LST and TEM combined analysis of defects in the OSF-ring of Cz-silicon crystals
Contributo in Atti di convegnoMemory effects in single-electron nanostructures
Contributo in Atti di convegnoNanocrystal MOS memories obtained by LPCVD deposition of Si nanograins
Contributo in Atti di convegnoNanocrystal MOS with silicon-rich oxide
Contributo in Atti di convegnoSilicon carbide: Defects and devices
ArticoloStrain Characterisation at the nm Scale of Deep Sub-Micron Devices by Convergent-Beam Electron Diffraction
Contributo in Atti di convegnoTEM and Photoluminescence Investigations of InGaAs/GaAs Quantum Well Layers
Contributo in Atti di convegnoTwo dimensional interstitial diffusion in mesoscopic structures
Contributo in Atti di convegnoNo Results Found