Skip to Main Content (Press Enter)

×
Home
Persone
Pubblicazioni
Strutture
Competenze

UNI-FIND

|

UNI-FIND

cnr.it

×
Home
Persone
Pubblicazioni
Strutture
Competenze

Pubblicazioni

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B

Rivista

Codice:

E094971

ISSN:

1071-1023

Dati Generali

Dati Generali

Pubblicazioni (110)

Ordina Pubblicazioni:

ascendente
decrescente

"Large area single photon detectors based on parallel configuration NbN nanowires"

Articolo

2-DIMENSIONAL SPREADING RESISTANCE PROFILING - RECENT UNDERSTANDINGS AND APPLICATIONS

Articolo

AlN and GaN epitaxial heterojunctions on 6H-SiC (0001): Valence band offsets and polarization fields

Articolo

Analysis of stress and composition of silicon nitride thin films deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition for microfabrication processes

Articolo

Assessing the performance of two-dimensional dopant profiling techniques

Articolo

Atomic force microscopy study of the morphological modifications induced by laser processing of Si(1-x)Gex/Si samples

Articolo

B clustering in amorphous Si

Articolo

Band bending and adsorption/desorption kinetics on N-polar GaN surfaces

Articolo

Characterization by x-ray photoelectron spectroscopy of the chemical structure of semi-insulating polycrystalline silicon thin films

Articolo

Coalescence inhibition in nanosized titania films and related effects on chemoresistive properties towards ethanol

Articolo

Comment on: "Epitaxial silicon grown on CeO2/Si(111) structure by molecular beam epitaxy"

Articolo

Comparative study of AZPN114 and SAL601 chemically amplified resists for electron beam nanolithography

Articolo

Controlling interface reactivity and Schottky barrier height in Au/ZnSe(001) junctions

Articolo

Crack formation in tensile InGaAs/InP layers

Articolo

Crack formation in tensile InGaAs/InP layers

Articolo

Deposition of silica-silver nanocomposites by magnetron cosputtering

Articolo

Depth profiling of ultrashallow B implants in silicon using a magnetic-sector secondary ion mass spectrometry instrument

Articolo

Design and prototyping of a micropropulsion system for microsatellites attitude control and orbit correction

Articolo

Dielectric thickness dependence of capacitive behavior in graphene deposited on silicon dioxide

Articolo

Direct measurement of laser momentum transfer to dense media by means of atomic force microscopy cantilevers

Articolo

Effect of lateral dimensional scaling on the thermal stability of thin CoSi2 layers reacted on polycrystalline silicon

Articolo

Electrical and structural properties of ultrathin SiON films on Si prepared by plasma nitridation

Articolo

Electrochemical fabrication of cobalt and nickel tips for scanning tunneling microscopy

Articolo

Electron scattering effects in master mask fabrication by single layer process for submicron x-ray lithography

Articolo

Environment influence on Ti diffusion and layer degradation of a SiC/Ni2Si/TiW/Au contact structure

Articolo

Experimental aspects and modeling for quantitative measurements in scanning capacitance microscopy

Articolo

Fabrication of 5 nm gap pillar electrodes by electron-beam Pt deposition

Articolo

Fabrication of a silicon-vacuum field-emission microdiode with a moving anode

Articolo

Fabrication of nickel diffractive phase elements for x-ray microscopy at 8 keV photon energy

Articolo

Fabrication of three-dimensional stamps for embossing techniques by lithographically controlled isotropic wet etching

Articolo

Fluorine incorporation in preamorphized silicon

Articolo

Functionalization and characterization of InAs and InP surfaces with hemin

Articolo

Fundamental reactions controlling anion exchange during the synthesis of Sb/As mixed-anion heterojunctions

Articolo

GROWTH IN ULTRAHIGH-VACUUM AND STRUCTURAL CHARACTERIZATION OF FESI2 ON SI(111)

Articolo

He implantation to control B diffusion in crystalline and preamorphized Si

Articolo

High direct energy band-gaps determination in InxAl1-xAs coherently grown on InP

Articolo

High resolution medium energy ion scattering analysis for the quantitative depth profiling of ultrathin high-k layers

Articolo

High-resolution complex structures for two-dimensional photonic crystals realized by x-ray diffraction lithography.

Articolo

High-resolution depth profiling of InxGa1-xAs/GaAs multiple quantum well structures by combination of secondary ion mass spectrometry and x-ray diffraction techniques

Articolo

III-Nitride growth and characteristics on ferroelectric materials using plasma-assisted MBE

Articolo

Imaging of single-stranded DNA with the scanning tunneling microscope

Articolo

Impact of unintentional and intentional nitridation of the 6H-SiC(0001)[sub Si] substrate on GaN epitaxy

Articolo

In situ spectroscopic ellipsometry to monitor surface plasmon resonant group-III metals deposited by molecular beam epitaxy

Articolo

Influence of a ZnTe buffer layer on the structural quality of CdTe epilayers grown on (100)GaAs by metalorganic vapor phase epitaxy

Articolo

Interconnecting single nano-objects on surfaces for transport experiments

Articolo

Investigation of a nanocrystalline silicon phase embedded in SiOx thin films grown by pulsed laser deposition

Articolo

Investigation of growth mode behavior and surface morphology evolution of metalorganic vapor phase epitaxy grown ZnTe layers on (001) GaAs

Articolo

Investigation of two dimensional diffusion of the self-interstitials in crystalline Si at 800 °C and at room temperature

Articolo

Investigation of two-dimensional diffusion of the self-interstitials in crystalline silicon at 800 degrees C and at room temperature

Articolo

Kinetics of gallium adlayer adsorption/desorption on polar and non-polar GaN surfaces

Articolo

KrF laser epitaxy of silicon germanium alloy layers by irradiation of Si (1-x)Ge x/Si (100) structures

Articolo

Low-energy electron microscopy/x-ray magnetic circular dichroism photoemission electron microscopy study of epitaxial MnAs on GaAs

Articolo

Magnetic field and temperature dependence of an AFM-defined quantum point contact

Articolo

Mn-induced growth of InAs nanowires

Articolo

Modification of Al/GaAs(001) Schottky Barriers by Means of Heterovalent Interface Layers

Articolo

Modification of Heterojunction Band Offsets at III-V/IV/III-V Interfaces

Articolo

Molybdenum-based nanostructured mixed oxides for sensing applications: Effect of the Mo oxide composition on the structure of sol-gel thin films

Articolo

NORMAL AND LATERAL FORCES IN SCANNING FORCE MICROSCOPY

Articolo

Nanocrystal metal-oxide-semiconductor memories obtained by chemical vapor deposition of Si nanocrystals

Articolo

Nanocrystal metal-oxide-semiconductor memories obtained by chemical vapor deposition of Si nanocrystals

Articolo

Nanofabrication by scanning probe microscope lithography: A review

Articolo

Nanoimprint lithography of high-density cobalt dot patterns for fine tuning of dipole interactions

Articolo

Nanoscale current transport through Schottky contacts on wide bandgap semiconductors

Articolo

Native extended defects in Zn1-yGdySe/InxGa1-xAs heterostructures

Articolo

Native extended defects in Zn1-yGdySe/InxGa1-xAs heterostructures

Articolo

Native extended defects in Zn1-yGdySe/InxGa1-xAs heterostructures

Articolo

One- and two-dimensional characterization of power metal-oxide-semiconductor structure by spreading resistance profiling: From the profiles to the I-V curves

Articolo

Optimization of electron beam induced deposition process for the fabrication of diode-like Pt/SiO2/W devices

Articolo

Ordered array of Ga droplets on GaAs(001) by local anodic oxidation

Articolo

Pattern matching, simulation, and metrology of complex layouts fabricated by electron beam lithography

Articolo

Reaction and thermal stability of cobalt disilicide on polysilicon: comparison between Si/Ti/Co and Si/Co multilayer system

Articolo

Real Time Optical Monitoring of PA-MBE of InN on SiC Substrates

Articolo

Redistribution and electrical activation of ultralow energy implanted boron in silicon following laser annealing

Articolo

Role of low-temperature (200 degrees C) nitridation in the growth of GaN by plasma-assisted molecular-beam epitaxy

Articolo

Role of the substrate in the C49-C54 transformation of TiSi2

Articolo

Room temperature migration of boron in crystalline silicon during secondary ion mass spectrometry profiling

Articolo

Roughness of thermal oxide layers grown on ion implanted silicon wafers

Articolo

SCHOTTKY-LIKE BEHAVIOR OF THE GaP(110)/Ag INTERFACE

Articolo

STRUCTURE AND DEFECT CHARACTERIZATION OF EPITAXIAL COSI2 ON SI(001) FORMED USING AN AMORPHOUS CO75W25 SPUTTERED LAYER

Articolo

STUDY OF THE ELECTRICAL ACTIVE DEFECTS INDUCED BY REACTIVE ION ETCHING IN N-TYPE SILICON

Articolo

Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures

Articolo

Scanning force and friction microscopy at highly oriented polycrystalline graphite and CuP2(100) surfaces in ultrahigh vacuum

Articolo

Scanning force microscopy of polyolefinic rubbers in homopolypropylene matrices

Articolo

Secondary-ion-mass spectrometry and high-resolution x-ray diffraction analyses of GaSb-AlGaSb heterostructures grown by molecular beam epitaxy

Articolo

Selective sublimation processing of a molybdenum-tungsten mixed oxide thin film

Articolo

Silicon laterally resonant microcantilevers for absolute pressure measurement with integrated actuation and readout

Articolo

Silicon resonant microcantilevers for absolute pressure measurement

Articolo

Simple lithographic technique for chip repairing using a light microscope

Articolo

Simulation of scanning capacitance microscopy measurements on ultranarrow doping profiles in silicon

Articolo

Simulation of scanning capacitance microscopy measurements on ultranarrow doping profiles in silicon

Articolo

Size effects on the electrical activation of low-energy implanted B in Si

Articolo

SnO2 lithographic processing for nanopatterned gas sensors

Articolo

Structural and electrical investigation of high temperature annealed As-implanted Si crystals

Articolo

Study of the H-2 remote plasma cleaning of InP substrate for epitaxial growth

Articolo

Study of the mechanisms of GaN film growth on GaAs surfaces by thermal and plasma nitridation

Articolo

Study of the mechanisms of GaN film growth on GaAs surfaces by thermal and plasma nitridation

Articolo

Surface characterization of sputtered niobium films by scanning tunneling microscopy

Articolo

Tailoring of the structural and magnetic properties of MnAs films grown on GaAs-strain and annealing effects

Articolo

Thermal stability of sio2/cosi2/polysilicon multilayer structures improved by cavity formation

Articolo

Thermal stability of thin CoSi2 layers on polysilicon implanted with As, BF2, and Si

Articolo

Thick pure Ge films for photodetectors

Articolo

Three-dimensional digital scanner based on micromachined micromirror for the metrological measurement of the human ear canal

Articolo

Triple crystal diffractometry, X-ray standing wave, and transmission electron microscopy investigation of shallow BF2 implantation in Si

Articolo

Tunable Schottky barrier contacts to InxGa1-xAs

Articolo

Two-dimensional effects on ultralow energy B implants in Si

Articolo

Two-dimensional electron gas formation in undoped In0.75Ga0.25As/In0.75Al0.25As quantum wells

Articolo

Two-dimensional junction profiling by selective chemical etching: Applications to electron device characterization

Articolo

Valence band alignment and work function of heteroepitaxial nanocrystals on GaAs(001)

Articolo

Zn preadsorption on GaAs(100)2×4 prior to ZnSe growth

Articolo

ZnSe/CdTe/ZnSe heterostructures

Articolo

No Results Found

«
‹

{pageNumber}

›
»

{startItem} - {endItem} di {itemsNumber}

Utilizzo dei cookie

Realizzato con VIVO | Designed by Cineca | 26.5.0.0 | Sorgente dati: PREPROD (Ribaltamento disabilitato)