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TECHNICAL DIGEST-INTERNATIONAL ELECTRON DEVICES MEETING
Series
Identifier:
E241298
ISSN:
2156-017X
Overview
Overview
Outputs (3)
A modified Schottky model for graphene-semiconductor (3D/2D) contact: A combined theoretical and experimental study
Conference Paper
Conductive-filament switching analysis and self-accelerated thermal dissolution model for reset in NiO-based RRAM
Conference Paper
Understanding the nature of metal-graphene contacts: a theoretical and experimental study
Academic Article
No Results Found
