Characterization of single frequency Yb:KYF4 lasers at 1.03 µm for optical frequency metrology

Academic Article

Publication Date:

2008

Iris type:

01.01 Articolo in rivista

List of contributors:

Laporta, Paolo; Galzerano, Gianluca

Handle:

https://iris.cnr.it/handle/20.500.14243/23876

Published in:

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT

Journal