Tunneling in frustrated total internal reflection: A comparison of different approaches
Academic Article
Publication Date:
2007
abstract:
Tunneling processes in frustrated total internal reflection are reexamined in order to compare the results already obtained from adopting a procedure based on a transition-element analysis with those recently reported on the basis of a statistical method applied to a Brownian-like motion. A close agreement between the two approaches can be established, at optical and microwave scales, when suitable values of the involved parameters are adopted.
Iris type:
01.01 Articolo in rivista
Keywords:
Tunneling; Path integration; Delay time
List of contributors:
Cacciari, Ilaria; Moretti, Paolo; Ranfagni, Anedio
Published in: