Data di Pubblicazione:
2005
Abstract:
We present a detailed investigation of the valence of manganese sites at the surface of colossal magnetoresistance La0.7Sr0.3MnO3 (LSMO) thin films by x-ray absorption spectroscopy (XAS). The XAS Mn L-edge spectra of epitaxial LSMO films usually show a peak or shoulder at 640 eV. Differences in the intensity of this feature are commonly attributed to slight changes in the Mn3+/Mn4+ ratio or the crystal field strength. By comparison of different XAS spectra of LSMO thin films with the known multiplet structure of Mn2+ in a cubic crystal field, we assign this 640-eV feature to Mn2+ ions. XAS with increased surface sensitivity, combined with photon energy-dependent photoelectron spectroscopy measurements of the Mn(3s) exchange splitting, show that the Mn2+ species are mainly located at the surface. The Mn2+ scenario indicates significant modification of the LSMO surface with respect to the bulk properties that should be taken into account in all the charge and spin tunneling and injection experiments.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
HALF-METALLIC FERROMAGNET; X-RAY ABSORPTION; SPIN INJECTION; SEMICONDUCTOR; RESISTANCE
Elenco autori:
Taliani, Carlo; Dediu, Valentin; Bergenti, Ilaria
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