nterpretation of holographic contour maps of reverse biased pn junctions

Reverse-biased p-n junctions have been observed by means of electron holography using a transmission electron microscope equipped with an electron biprism and a field emission gun. Aim of this work is to present and discuss an analytical model for the electric field associated to a periodic array of alternating p and n stripes lying in a half-plane which simulates the experimental setup and allows the interpretation of the main features of the observed holograms and the quantitative evaluation of the effect of the fringing field on the holograms and on the reconstructed images