EBIC assessment of semiconductors properties

Chapter

Publication Date:

2003

Iris type:

02.01 Contributo in volume (Capitolo o Saggio)

Keywords:

EBIC; difetti; ricombinazione

List of contributors:

Frigeri, Cesare

Handle:

https://iris.cnr.it/handle/20.500.14243/139093

Book title:

Science, Technology and Education of Microscopy: an Overview