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Studying the surface reaction between NiO and Al2O3via total reflection EXAFS (ReflEXAFS)

Articolo
Data di Pubblicazione:
2014
Abstract:
The reaction between NiO and (0001)- and (1 1102)-orientedAl2O3single crystals has been investigated on model experimental systems by using the ReflEXAFS technique. Depth-sensitive information is obtained by collecting data above and below the critical angle for total reflection. A systematic protocol for data analysis, based on the recently developedCARDcode, was implemented, and a detailed description of the reactive systems was obtained. In particular, for (1 1102)-oriented Al2O3, the reaction with NiO is almost complete after heating for 6 h at 1273 K, and an almost uniform layer of spinel is found below a mixed (NiO + spinel) layer at the very upmost part of the sample. In the case of the (0001)-oriented Al2O3, for the same temperature and heating time, the reaction shows a lower advancement degree and a residual fraction of at least 30% NiO is detected in the ReflEXAFS spectra.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
D'Acapito, Francesco
Autori di Ateneo:
D'ACAPITO FRANCESCO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/255878
Pubblicato in:
JOURNAL OF SYNCHROTRON RADIATION (ONLINE)
Journal
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