GeO2-doped SiO2 thin films deposited by RF sputtering: morphology and optical properties

Academic Article

Publication Date:

2004

Iris type:

01.01 Articolo in rivista

List of contributors:

Quartarone, Eliana; Mustarelli, Piercarlo

Handle:

https://iris.cnr.it/handle/20.500.14243/21838