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Monolithic integration of optical grade GaAs on Si (001) substrates deeply patterned at a micron scale

Articolo
Data di Pubblicazione:
2013
Abstract:
Dense arrays of micrometric crystals, with areal filling up to 93%, are obtained by depositing GaAs in a mask-less molecular beam epitaxy process onto Si substrates. The substrates are patterned into tall, micron sized pillars. Faceted high aspect ratio GaAs crystals are achieved by tuning the Ga adatom for short surface diffusion lengths. The crystals exhibit bulk-like optical quality due to defect termination at the sidewalls. Simultaneously, the thermal strain induced by different thermal expansion parameters of GaAs and Si is fully relieved. This opens the route to thick film applications without crack formation and wafer bowing.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
GaAs/Si nanocrystals; MBE; optical grade GaAs; TEM; patterned Si
Elenco autori:
Frigeri, Cesare; Bollani, Monica
Autori di Ateneo:
BOLLANI MONICA
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/255524
Pubblicato in:
APPLIED PHYSICS LETTERS
Journal
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