Complementary study of Indentation-induced dislocations in GaAs and InP by Photoetching, SEM, EBIC and SPL
Abstract
Publication Date:
1993
Iris type:
04.02 Abstract in Atti di convegno
Keywords:
GaAs; InP; Indentation; EBIC; photoetching
List of contributors:
Fornari, Roberto; Frigeri, Cesare
Book title:
Abstract book