The complementary use of PIXE-alfa and XRD non destructive portable system for the quantitative analysis of painted surface

In the present work the portable PIXE- system realized within a collaboration between the IBAM/CNR, the INFN/LANDIS (Catania, Italy) and the CEA/LIST (Saclay, France) has been used, in combination with the upgraded XRD diffractometer, for non destructive analysis. It is shown that, by combining the two techniques, quantitative analysis is possible in selected cases. Application to Roman frescoes fragments coming from different archaeological sites of Catania (Italy) is presented.