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Doped silicon and NIS junctions for bolometer applications

Academic Article
Publication Date:
2004
abstract:
We discuss the performance, of a normal metal hot electron bolometer (NHEB) that we have measured at 0:3 K: We found that the noise equivalent power was limited by the amplifier noise. To improve the NHEB power response and to make it more robust and reliable we propose to substitute the normal metal with heavily doped silicon. The heavily doped silicon behaves like a metal with lower carrier concentration and has a smaller electron-phonon thermal coupling. We have fabricated superconductor-doped silicon-superconductor contacts (S-Sm-S) and we have used them as thermometers and coolers.
Iris type:
01.01 Articolo in rivista
List of contributors:
Castellano, MARIA GABRIELLA; Mattioli, Francesco; Leoni, Roberto; Torrioli, Guido
Authors of the University:
MATTIOLI FRANCESCO
TORRIOLI GUIDO
Handle:
https://iris.cnr.it/handle/20.500.14243/20889
Published in:
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT
Journal
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