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Calculation of metamorphic two-dimensional quantum energy system: Application to wetting layer states in InAs/InGaAs metamorphic quantum dot nanostructures

Academic Article
Publication Date:
2013
abstract:
In this work, we calculate the two-dimensional quantum energy system of the In(Ga)As wetting layer that arises in InAs/InGaAs/GaAs metamorphic quantum dot structures. Model calculations were carried on the basis of realistic material parameters taking in consideration their dependence on the strain relaxation of the metamorphic buffer; results of the calculations were validated against available literature data. Model results confirmed previous hypothesis on the extrinsic nature of the disappearance of wetting layer emission in metamorphic structures with high In composition. We also show how, by adjusting InGaAs metamorphic buffer parameters, it could be possible: (i) to spatially separate carriers confined in quantum dots from wetting layer carriers, (ii) to create an hybrid 0D-2D system, by tuning quantum dot and wetting layer levels. These results are interesting not only for the engineering of quantum dot structures but also for other applications of metamorphic structures, as the two design parameters of the metamorphic InGaAs buffer (thickness and composition) provide additional degrees of freedom to control properties of interest. (C) 2013 AIP Publishing LLC.
Iris type:
01.01 Articolo in rivista
Keywords:
MU-M; RESIDUAL STRAIN; GAAS SUBSTRATE; GROWTH; SEMICONDUCTORS
List of contributors:
Frigeri, Paola; Seravalli, Luca; Trevisi, Giovanna
Authors of the University:
FRIGERI PAOLA
SERAVALLI LUCA
TREVISI GIOVANNA
Handle:
https://iris.cnr.it/handle/20.500.14243/254555
Published in:
JOURNAL OF APPLIED PHYSICS
Journal
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URL

http://scitation.aip.org/content/aip/journal/jap/114/18/10.1063/1.4830021
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