Publication Date:
1992
abstract:
We produced a set of solar cells based on the design called "Junction Near Local Defect Layer" [1]. This design was reported to be able to produce a 69 mA/cm2 short circuit current density, due to a very defective carrier pairs generation occurring in a defect layer produced by hydrogen implantation and located next to the junction. Our results do not seem to confirm this occurrence. No increase is detected in short circuit current, while the open circuit voltage is shown to decrease of about 20%. Neverthelesss, many points remain obscure, and our conclusion is that the final word cannot be said.
Iris type:
04.01 Contributo in Atti di convegno
List of contributors: