Ti/Al ohmic contacts on AlGaN/GaN heterostructures with different defect density

Academic Article

Publication Date:

2014

abstract:

[object Object]

Iris type:

01.01 Articolo in rivista

Keywords:

AlGaN/GaN; Ohmic contact; Ti/Al; V-defects

List of contributors:

Greco, Giuseppe; Bongiorno, Corrado; Roccaforte, Fabrizio; Giannazzo, Filippo

Authors of the University:

BONGIORNO CORRADO

GIANNAZZO FILIPPO

GRECO GIUSEPPE

ROCCAFORTE FABRIZIO

Handle:

https://iris.cnr.it/handle/20.500.14243/253361

Published in:

APPLIED SURFACE SCIENCE

Journal

Overview

URL

http://www.scopus.com/inward/record.url?eid=2-s2.0-84906693630&partnerID=q2rCbXpz