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Electron Microscopy Characterization of Low-Dimensional Semiconductor Structures Grown on V-Grooved Substrates

Contributo in Atti di convegno
Data di Pubblicazione:
1997
Abstract:
We present an overview of various low-dimensional structures that can be produced using the approach of growth on V-grooved substrates in the GaAs/AlGaAs and InGaAs/AlGaAs material systems. We discuss both conventional quantum wire and vertical quantum well structures, as well as novel superlattice structures. Structural information derived from transmission electron microscopy and cathodoluminescence spectra of these structures are presented.
Tipologia CRIS:
04.01 Contributo in Atti di convegno
Elenco autori:
Biasiol, Giorgio
Autori di Ateneo:
BIASIOL GIORGIO
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/118437
Pubblicato in:
INSTITUTE OF PHYSICS CONFERENCE SERIES
Series
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