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Fitting the momentum dependent loss function in EELS

Articolo
Data di Pubblicazione:
2011
Abstract:
Momentum dependent inelastic plasmon scattering can be measured by electron energy loss in a transmission electron microscope. From energy filtered diffraction, the characteristic angle of scattering and the cutoff angle are measured, using a thin film of aluminum as a model test. Rather than deconvolving the data (as done in previous works), a fitting technique is used to extract the loss function from angular resolved spectra, starting from a simple model simulation. © 2010 Wiley-Liss, Inc.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
electron energy loss; plasmon width; loss function; model based
Elenco autori:
Bertoni, Giovanni
Autori di Ateneo:
BERTONI GIOVANNI
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/19202
Pubblicato in:
MICROSCOPY RESEARCH AND TECHNIQUE (PRINT)
Journal
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