A study of dislocations in Te-doped GaAs using electron and optical beams

Abstract
Publication Date:
1996
Iris type:
04.02 Abstract in Atti di convegno
Keywords:
GaAs; Te-doped; TEM; optical method
List of contributors:
Handle:
https://iris.cnr.it/handle/20.500.14243/134459
Book title:
Abstract book