Nanoscale formation of new solid-state compounds by topochemical effects: The interfacial reactions ZnO with Al(2)O(3) as a model system
Academic Article
Publication Date:
2009
abstract:
The chemical reactivity of thin layers (ca.10 nm thick) of ZnO deposited onto differently oriented
Al2O3single crystals has been investigated by means of Atomic Force Microscopy inspections and
X-Ray Absorption Spectroscopy at the Zn-K edge. The (0 0 0 1)ZnO|| (1 1
_
20)sapphireinterface
yields the ZnAl2O4spinel and a quite stable film morphology. Instead, the (1 1
_
2 0)ZnO|| (1 10
2)sapphireand (0 0 0 1)ZnO|| (0 0 0 1)sapphireinterfaces give origin to a new compound (or, possibly,
even two new compounds), whose chemical nature is most likely that of a ZnO/Al2O3phase, with
still unknown composition and crystal structure. In addition, in the last two cases, films collapse
into prismatic twins of ca.1 ?m in dimension. These experimental findings demonstrate that in a
solid state reaction, the topotactical relationships between the reacting solids are of crucial
importance not only in determining the kinetic and mechanisms of the process in its early stages,
but even the chemical nature of the product.
Iris type:
01.01 Articolo in rivista
List of contributors:
Quartarone, Eliana; Ghigna, Paolo; Mustarelli, Piercarlo; Spinolo, Giorgio; Calestani, Gianluca; Migliori, Andrea; D'Acapito, Francesco
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