Large exchange bias enhancement in (Pt(or Pd)/Co)/IrMn/Co trilayers with ultrathin IrMn thanks to interfacial Cu dusting
Articolo
Data di Pubblicazione:
2014
Abstract:
The magnitude of exchange bias (H-ex) at room temperature can be significantly enhanced in IrMn/Co and (Pt(or Pd)/Co)/IrMn/Co structures thanks to the insertion of an ultrathin Cu dusting layer at the IrMn/Co interface. The combination of trilayer structure and interfacial Cu dusting leads to a three-fold increase in H-ex as compared to the conventional IrMn/Co bilayer structure, with an increased blocking temperature (T-B) and a concave curvature of the temperature dependence H-ex(T), ideal for improved Thermally Assisted-Magnetic Random Access Memory storage layer. This exchange bias enhancement is ascribed to a reduction of the spin frustration at the IrMn/Co interface thanks to interfacial Cu addition. (C) 2014 AIP Publishing LLC.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Multilayers; Temperature measurement; Copper; Crystal structure; Tantalum; Exchange interactions; Interface structure; Interfacial properties; Coercive force; Magnetic tunnel junctions
Elenco autori:
Vinai, GIOVANNI MARIA
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