Publication Date:
2005
abstract:
Single Pole Single Through (SPST) series micromachined switches have been characterized to check their reliability under low (< 3dBm) and medium (23 dBm) power cycling.
Iris type:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
RF MEMS; power handling; reliability
List of contributors:
Catoni, Simone; Minucci, Gianluca; Marcelli, Romolo
Book title:
Advanced MEMS for RF and Millimeter Wave Communications