Data di Pubblicazione:
2001
Abstract:
Advances in the understanding of surface phenomena and in the
development of nanotechnology increasingly rely on characterization
tools with both elemental and surface structural sensitivity. The
local atomic structure of adsorbed species or thin layers grown on
single crystal surfaces can provide a better physical and chemical
insight into the basic mechanism of surface phenomena and can be used
as a starting point for the calculation of the electronic properties.
Photoelectron diffraction is a powerful experimental technique able to yield
such an information. Its combination of chemical, structural and
surface sensitivity yields a quantitative description of the local
atomic geometry of the first layers of solids.
Tipologia CRIS:
02.01 Contributo in volume (Capitolo o Saggio)
Elenco autori:
Bondino, Federica
Link alla scheda completa:
Titolo del libro:
Synchrotron Radiation: Fundamentals, Methodologies and Applications
Pubblicato in: