Data di Pubblicazione:
1999
Abstract:
In view of practical applications requiring diamond films, plates and membranes with very smooth surfaces, ArF excimer laser
polishing treatments were applied to thin (30 mm) diamond films grown by CVD on silicon substrates. The as-prepared diamond
surfaces and the laser-treated parts of the samples were characterised by SEM analysis, Raman and micro-Raman spectroscopy.
The presence on the laser-treated surface of a thin amorphous carbon layer responsible for the higher surface electrical conductivity
and for the different optical reflectivity properties was evidenced. Using confocal micro-Raman spectroscopy a comparative depth
profile analysis of the phase quality, below the surface in different regions of the films, was carried out. After short (10 min)
treatment by H2 plasma etching in the CVD chamber the graphitic top layer was completely removed from the samples.
Tipologia CRIS:
01.01 Articolo in rivista
Keywords:
Diamond films; Laser treatment; Surface modifications; Micro-Raman characterisation
Elenco autori:
Cappelli, Emilia; Pinzari, Fulvia; Orlando, Stefano
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