Light scattering characterization of metallic single films and multilayers

Brillouin light scattering has been exploited to investigate Ni thin "lms with thicknesses in the range 25}56 nm, and a Ni/Cu/Ni multilayer deposited by RF sputtering. The Brillouin spectra exhibit both surface and bulk modes. The spin wave frequencies and light cross sections have been calculated taking into account both dipolar and exchange interactions, as well as perpendicular surface anisotropy. The analysis of the dispersion curves allowed the determination of the magnetic parameters of the samples.