SAXES, a high resolution spectrometer for resonant x-ray emission in the 400-1600 eV energy range
Articolo
Data di Pubblicazione:
2006
Abstract:
We present a 5 m long spectrometer for soft x rays to be used at a synchrotron radiation beamline
for resonant x-ray emission spectroscopy and resonant inelastic x-ray scattering in the 400-1600 eV
energy range. It is based on a variable line spacing spherical grating average groove density of
3200 mm-1, R=58.55 m and a charge coupled device two dimensional detector. With an x-ray spot
on the sample of 10 m, the targeted resolving power is higher than 10 000 at all energies below
1100 eV and better than 7000 at 1500 eV. The off-line tests made with Al and Mg K1,2
fluorescence emissions indicate that the spectrometer can actually work at 12 000 and 17 000
resolving power at the L3 edges of Cu 930 eV and of Ti 470 eV, respectively. SAXES
superadvanced x-ray emission spectrometer is mounted on a rotating platform allowing to vary the
scattering angle from 25° to 130°. The spectrometer will be operational at the ADRESS advanced
resonant spectroscopies beamline of the Swiss Light Source from 2007.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Braicovich, Lucio; Dallera, Claudia; Ghiringhelli, GIACOMO CLAUDIO
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