Low Energy Electronic Excitations in the Layered Cuprates Studied by Copper L3 Resonant Inelastic X-Ray Scattering
Articolo
Data di Pubblicazione:
2004
Abstract:
We have measured the resonant inelastic x-ray scattering (RIXS) spectra at the Cu L3 edge in a
variety of cuprates. Exploiting a considerably improved energy resolution (0.8 eV) we recorded
significant dependencies on the sample composition and orientation, on the scattering geometry, and
on the incident photon polarization. The RIXS final states correspond to two families of electronic
excitations, having local (dd excitations) and nonlocal (charge-transfer) character. The dd energy
splitting can be estimated with a simple crystal field model. The RIXS at the L3 edge demonstrates here
a great potential, thanks to the resonance strength and to the large 2p spin-orbit splitting.
Tipologia CRIS:
01.01 Articolo in rivista
Elenco autori:
Braicovich, Lucio; Tagliaferri, Alberto; Dallera, Claudia; Ghiringhelli, GIACOMO CLAUDIO; Annese, Emilia
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