Polarization and higher order content measurement of a soft-x-rays monochromatized beam with Mo/Si multi-layers

A Mo-Si multilayer mirror has been used for determination of the ellipticity and higher-order content of a synchrotron beam. The method is based on the angular measure of multilayer reflectivity in the region of Bragg first- and second-order reflections. Beam parameters were derived by a fitting procedure. © 2006 Optical Society of America.