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Nanoscale modification of graphene transport properties by ion irradiation

Academic Article
Publication Date:
2010
abstract:
Single layers of graphene (SLG) mechanically exfoliated from highly oriented pyrolytic graphite and deposited on SiCVSi were irradiated with C + ions at different fluences (from 10 13 to 10 14cm -2), in order to modify the transport properties in controlled way. Using a method based on scanning probe microscopy, local measurements of the electron mean free path (I) have been carried out both on pristine and ion irradiated SLG. A lateral inhomogeneity of l was found in both cases, with an increasing spread in the distribution of l for larger fluences. Before irradiation, the spread was explained by the inhomogeneous distribution of charged impurities on SLG surface and/or at the interface with SiO 2. After irradiation, lattice vacancies cause a local reduction of l in the damaged regions. (c) 2010 Materials Research Society.
Iris type:
01.01 Articolo in rivista
Keywords:
Charged impurity; Damaged region; Electron mean free path; Fluences; Highly oriented pyrolytic graphite; Inhomogeneous distribution; Ion irradiation; Lateral inhomogeneity; Lattice vacancy; Local measurement; Nanoscale modifications; Single layer; Graphene; Ions; Irradiation; Scanning probe microscopy; Silicon compounds; Transport properties
List of contributors:
Giannazzo, Filippo
Authors of the University:
GIANNAZZO FILIPPO
Handle:
https://iris.cnr.it/handle/20.500.14243/247208
Published in:
MATERIALS RESEARCH SOCIETY SYMPOSIA PROCEEDINGS
Journal
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