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Study of the plasma plume generated during near IR femtosecond laser irradiation of silicon targets

Academic Article
Publication Date:
2004
abstract:
Ti:sapphire femtosecond laser ablation of silicon has been investigated by Langmuir probe and time-gated optical emission spectroscopy. The measured spectra show the presence of a fast ion population preceding the main plume core of slow ions and neutrals produced by a thermal ablation mechanism. By analyzing the fluence thresholds for the emission of the two ion populations, we provide clear experimental evidence that fast ions are ejected non-thermally from the sample surface as a result of the Si surface supercritical state induced by the intense ultrashort laser pulse irradiation.
Iris type:
01.01 Articolo in rivista
Keywords:
TIME-OF-FLIGHT; ION EMISSION; ABLATION; SPECTROSCOPY; DEPOSITION
List of contributors:
Amoruso, Salvatore; Bruzzese, Riccardo; DE LISIO, Corrado; Wang, Xuan
Authors of the University:
WANG XUAN
Handle:
https://iris.cnr.it/handle/20.500.14243/1416
Published in:
APPLIED PHYSICS. A, MATERIALS SCIENCE & PROCESSING
Journal
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http://www.springerlink.com/content/42mjtmkmb6etjjq0/?MUD=MP
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