XPS ANALYSIS ON SAMPLES FROM RFX TILES

Tiles coming from different positions, with respect to the toroidal and poloidal coordinates, of the first wall of RFX have been analized via XPS at Istituto di Fisica del Plasma. The objectives are to study the erosion and deposition effects during the discharge and to look at the quality of the boron deposition. Depth profiling has been carried out on same samples via Ar sputtering. The paper discussees about the changes in the erosion and deposizion rates in view of the finding.