Influence of compositional macrosteps on the reduction of the critical thickness by generation of <010> misfit dislocations in InGaAs/GaAs quantum wells
Abstract
Publication Date:
2000
Iris type:
04.02 Abstract in Atti di convegno
Keywords:
InGaAs/GaAs; misfit dislocations; TEM
List of contributors:
Frigeri, Cesare
Book title:
Abstract book