Publication Date:
2010
abstract:
Photonic force microscopy is a scanning probe technique based on the use of optical tweezers. An optically trapped probe particle is scanned over a surface or in a three-dimensional structured environment to probe force interactions. This technique is capable of force sensing at the sub-piconewton level with spatial reso- lution in the nanometre range depending on the dimensions of the trapped particle used as probe. Here we review some recent advances in the technique focussing on applications based on the use of linear nanostructures, bio-force sensing and imaging, and integration with ultra-sensitive spectroscopy such as Raman tweezers.
Iris type:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
Optical Tweezers; Photonic Force Microscopy; Force Sensing; Bionanotechnology; Raman Tweezers
List of contributors:
Gucciardi, PIETRO GIUSEPPE; Marago', Onofrio
Book title:
Scanning Probe Microscopy in Nanoscience and Nanotechnology