Lattice parameter and alloy fraction determination of Pbx Sn1-x Te films by RHEED double-patterns

A new technique to determine simultaneously the structure, the lattice parameter and the alloy stoichiometric composition of Pbx Sn1-x Te films r.f. sputtered into different substrates has been developed by making use of Reflection High Energy Electron Diffraction (RHEED) double-patterns. This method is available with all the materials for which the lattice constant is related to the alloy composition.