AFM approaches to the study of PDMS-Au and carbon-based surfaces and interfaces

Capitolo di libro
Data di Pubblicazione:
2016
Abstract:
This chapter contains sections titled: Introduction AFM Characterization of Micro-Nano Surfaces and Interfaces of Carbon-Based Materials and PDMS-Au Nanocomposites 3D Image Processing: ImageJ Tools Scanning Capacitance Microscopy, Kelvin Probe Microscopy, and Electromagnetic Characterization AFM Artifacts Conclusions (General Guidelines for Material Characterization by AFM) Acknowledgments
Tipologia CRIS:
02.01 Contributo in volume (Capitolo o Saggio)
Keywords:
AFM; SCM; KPM; Electromagnetic characterization; 3D image processing; nanodiamond powders; PDMS-Au nanomaterials; image artifacts
Elenco autori:
Autori di Ateneo:
Link alla scheda completa:
https://iris.cnr.it/handle/20.500.14243/325570
Titolo del libro:
Advanced Materials Interfaces