Reliable response of RF MEMS LTCC packaged switches after mechanical and thermal stress
Conference Paper
Publication Date:
2014
Iris type:
04.01 Contributo in Atti di convegno
Keywords:
RF MEMS
List of contributors:
Bartolucci, Giancarlo; Proietti, Emanuela; Lucibello, Andrea; Capoccia, Giovanni; Marcelli, Romolo
Book title:
Proceed. of DTIP 2014, SYMPOSIUM on Design, Test, Integration & Packaging of MEMS/MOEMS