Scanning force and friction microscopy at highly oriented polycrystalline graphite and CuP2(100) surfaces in ultrahigh vacuum

We present a novel scanning force and friction microscope for applications in ultrahigh vacuum (UHV) using the optical beam deflection method for detection. All optical components are positioned on the air side enabling a simple way of adjustment, the possibility of good decoupling of topography and lateral signal, and the absolute estimation of lateral force values, We demonstrate lateral atomic resolution on mica surfaces freshly cleaved in UHV. As model systems, we investigate the complex CuP2(100) surface on the unit cell level which exhibits a wide range of atomic stick-slip phenomena. In addition, first results on the friction behavior at step edges on highly oriented polycrystalline graphite surfaces are presented.