Analysis and Optimal Design of Self-Diagnosable Systems with Repair

A new approach to the problem of diagnosability with repair of digital systems composed of n units, of which at most t are faulty, is introduced. Sufficient conditions on the t-fault diagnosability with repair are given which improve the ones which are in the literature. For some values of t and n, optimal designs are given and a class of optimal designs with t = L(n - 1)/2] is identified which needs only 3[n/2] - 5 testing connections among the units.