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Low electrode induced optical losses in organic active single layer polyfluorene waveguides with two indium tin oxide electrodes deposited by pulsed laser deposition

Academic Article
Publication Date:
2006
abstract:
We demonstrate that 20 nm thick indium tin oxide (ITO) layers deposited by pulsed laser deposition present sheet resistance as low as 130 Omega/square and very uniform morphology, with an average roughness of about 0.4 nm, and peak-to-valley roughness as low as 8.2 nm. This good uniformity allowed us to realize a single layer polyfluorene active waveguide with both top and bottom ITO electrodes showing clear amplified spontaneous emission and electrode induced losses as low as 3.0 cm(-1). We investigated the effects of hole injection in the ASE intensity concluding that complete gain suppression due to polaron absorption would take place for current density of about 360 mA cm(-2). (c) 2006 American Institute of Physics.
Iris type:
01.01 Articolo in rivista
Keywords:
DISTRIBUTED-FEEDBACK LASERS; SEMICONDUCTOR THIN-FILMS; EMITTING DIODE; LASING ACTION; EMISSION
List of contributors:
Anni, Marco
Handle:
https://iris.cnr.it/handle/20.500.14243/161554
Published in:
APPLIED PHYSICS LETTERS
Journal
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