INTEGRATED PHOTONICS Device-level photonic testing

Articolo

Data di Pubblicazione:

2015

Abstract:

Non-invasive, multispectral characterization of integrated photonic circuits paves the way towards optical methodologies ready for industrial applications.

Tipologia CRIS:

01.01 Articolo in rivista

Keywords:

silicon; space

Elenco autori:

Burresi, Matteo

Link alla scheda completa:

https://iris.cnr.it/handle/20.500.14243/335629

Pubblicato in:

NATURE PHOTONICS (PRINT)

Journal