Drain induced barrier lowering and impact ionization effects in short channel polysilicon TFTs

Conference Paper

Publication Date:

2008

Iris type:

04.01 Contributo in Atti di convegno

List of contributors:

Gaucci, Paolo; Maiolo, Luca; Mariucci, Luigi; Pecora, Alessandro; Fortunato, Guglielmo; Valletta, Antonio; Cuscuna', Massimo

Authors of the University:

CUSCUNA' MASSIMO

MAIOLO LUCA

MARIUCCI LUIGI

PECORA ALESSANDRO

VALLETTA ANTONIO

Handle:

https://iris.cnr.it/handle/20.500.14243/69345