Wafer-level measurement of thin films thermoelectric power

Conference Paper

Publication Date:

2005

Iris type:

04.01 Contributo in Atti di convegno

List of contributors:

Mancarella, Fulvio; Cristiani, Stefano; Roncaglia, Alberto; Sanmartin, Michele; Severi, Maurizio; Cardinali, GIAN CARLO

Authors of the University:

CRISTIANI STEFANO

MANCARELLA FULVIO

RONCAGLIA ALBERTO

SANMARTIN MICHELE

Handle:

https://iris.cnr.it/handle/20.500.14243/69303