Dark counts double switching rates in NbTiN Superconducting Nanowire Single Photon Detectors

In this work we present a study of the dark counts rate in a NbTiN Superconducting Nanowire Single Photon Detectors (SNSPD). We measure the distribution of the time intervals elapsed between two consecutive dark pulses at the fixed temperature of 4,2K. Due to the stochastic nature of the dark counts, the distribution is expected to have a Poisson shape but what we observe is a combination of two Poisson-like processes. A further analysis of the distributions dependence on the bias current highlights that the weight of the two process is not constant. In the scenario presented by Ejrnaes et al. [1], this result can confirm that, in this temperature regime, dark counts are generated mainly by multiple consecutive fluctuation events and the contribution to the dark counts rate coming from single fluctuations increases in the high bias current region.