Electric-field screening in atomically thin layers of MoS2: The role of interlayer coupling

Academic Article

Publication Date:

2013

abstract:

The electrostatic screening in single and few-layer MoS2 sheets is studied. Electrostatic force microscopy is used to probe the electric field generated by charge impurities in the substrate and incompletely screened by MoS2 sheets. A non-linear Thomas-Fermi theory is employed to interpret the experimental results, demonstrating the important role of the interlayer coupling in the screening of MoS2.

Iris type:

01.01 Articolo in rivista

Keywords:

electric-field screening; MoS2; two-dimensional crystals; Thomas-Fermi theory; electrostatic force microscopy (EFM)

List of contributors: